Non-negative matrix factorisation factors and loadings determined from a tilt-series of scanning precession electron diffraction measurements on an Ni-base superalloy sample. The major microstructure components (gamma-matrix, eta-precipitate and metal carbide [MC] phases) are separated into factors (representative diffraction patterns) and loadings (contributions to each point in the scan). In addition an image of a defocussed convergent beam electron diffraction pattern at 0 degrees tilt is included to allow the rotation relationship between the image axes and the diffraction pattern axes to be determined.

This data supports "Scanning precession electron tomography for three-dimensional nanoscale orientation imaging and crystallographic analysis" which has been published in Nature Communications.