On the failure of graphene devices by Joule heating under current stressing conditions
Accepted version
Peer-reviewed
Repository URI
Repository DOI
Change log
Authors
Durkan, Colm https://orcid.org/0000-0001-9398-2813
Xiao, Zhuocong https://orcid.org/0000-0003-2167-1623
Abstract
jats:pThe behaviour of single layer graphene sections under current-stressing conditions is presented. Graphene devices are stressed to the point of failure, and it is seen that they exhibit Joule heating. Using a simple 1-D model for heat generation, we demonstrate how to extract values for the resistivity and thermal coefficient of resistance of graphene devices from their current-voltage characteristics. We also show that graphene flakes with a large number of ripples and folds have higher resistance and fail along a connected pathway of folds.</jats:p>
Description
Keywords
graphene, Joule heating, devices, tunneling
Journal Title
Applied Physics Letters
Conference Name
Journal ISSN
0003-6951
1077-3118
1077-3118
Volume Title
107
Publisher
AIP Publishing