Research data supporting “Spectroscopic ellipsometry characterization of ZnO:Sn thin films with various Sn composition deposited by remote-plasma reactive sputtering”
Repository URI
Repository DOI
Change log
Authors
Janicek, P.
Niang, Kham M.
Mistrik, J.
Palka, K.
Flewitt, Andrew J.
Description
Data generated in the characterization and analysis of the Zinc Tin Oxide thin films (as shown in the Figures in the manuscript)
Version
Software / Usage instructions
microsoft office
Keywords
spectroscopic ellipsometry, Zinc Tin Oxide, sputtering, optical properties
Publisher
University of Cambridge
Sponsorship
EPSRC [EP/M013650/1]