Structural characterization of Si-ion irradiated Zr/Nb nano-multilayers with different individual layer thicknesses
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Dataset
Change log
Authors
Callisti, M
Karlik, Miroslav
Polcar, Tomas
Description
XRD and HR-TEM analyses of Si-ion irradiated Zr/Nb nanoscale multilayers with different individual layer thicknesses.
Version
Software / Usage instructions
Gatan Microscopy Suite Software - free download from Gatan webpage
OriginLab
Keywords
Radiation hardening, Interfaces, Multilayers, Transmission electron microscopy (TEM), Nanoindentation
Publisher
Sponsorship
Technology Strategy Board (113072)
Innovate UK (reference number: 113072)
Czech Science Foundation through the project 17-17921S and by the ERDF project No. CZ.02.1.01/0.0/0.0/15_003/0000485.