Radio-Frequency Capacitive Gate-based Sensing for Silicon CMOS Quantum Electronics
Repository URI
Repository DOI
Change log
Authors
Abstract
This thesis focuses on implementing radio frequency (rf) reflectometry techniques for dispersive detection of charge and spin dynamics in nanoscale devices. I have investigated three aspects of rf reflectometry using state-of-the-art silicon (Si) complementary metal-oxide-semiconductor (CMOS) nanowire field effect transistors (NWFETs).
First, a high-sensitivity capacitive gate-based charge sensor is developed by optimising the external matching circuit to detect capacitive changes in the high frequency resonator. A new circuit topology is used where superconducting niobium nitride (NbN) inductor is connected in parallel with a single-gate Si NWFET resulting in resonators with loaded Q-factors in the 400-800 range. For a resonator operating at 330 MHz, I have achieved a charge sensitivity of 7.7
Second, this new circuit topology for the resonator is used with a dual-gate Si NWFET. This dual-gate device geometry provides access to a double quantum dot (DQD) system in few electron regime. The spin-state of the two-electron DQD system is detected dispersively using Pauli spin blockade between joint singlet S(2,0) and triplet T
Third, I expand the range of applications of gate-based sensing to accurate temperature measurements. I have experimentally demonstrated a primary thermometer by embedding a single-gate Si NWFET with the rf capacitive gate-based sensor. The thermometer, termed as gate-based electron thermometer (GET), relies on cyclic electron tunneling between discrete energy levels of a quantum dot and a single electron reservoir in the NWFET. I have found that the full-width-half-maximum (FWHM) of the resonator phase response depends linearly with temperature via well known physical law by using the ratio
Description
Date
Advisors
Gonzalez-Zalba, Miguel Fernando