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Mapping the complex refractive index of single layer graphene on semiconductor or polymeric substrates at terahertz frequencies

Published version
Peer-reviewed

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Authors

Pistore, V 
Balci, O 
Schinde, SM 
Meersha, A 

Abstract

jats:titleAbstract</jats:title> jats:pAssessing experimentally the main optical parameters of graphene (e.g. complex refractive index, carrier density, mobility) in the far-infrared (0.1–10 THz) is important for quantum science, due to the possibility to devise miniaturized devices (frequency combs, random lasers), components (optical switches, spatial light modulators, metamaterial mirrors and modulators) or photonic circuits, in which graphene can be integrated with existing semiconductor technologies to manipulate their optical properties and induce novel functionalities. Here, we combine time domain terahertz (THz) spectroscopy and Fourier transform infrared spectroscopy to extract the complex refractive index of large (∼1cmjats:sup2</jats:sup>) area single layer graphene on thin (∼0.1-1 jats:italicµ</jats:italic>m) polymeric suspended substrates, flexible and transparent films, and high reflectivity Si substrates in the 0.4–1.8 THz range. We model our data to extract the relevant optical (refractive index, absorption coefficient, penetration length) electronic (Fermi velocity) and electrical (carrier density, mobility) properties of the different graphene samples.</jats:p>

Description

Keywords

refractive index, graphene, optical properties, terahertz

Journal Title

2D Materials

Conference Name

Journal ISSN

2053-1583
2053-1583

Volume Title

9

Publisher

IOP Publishing
Sponsorship
Engineering and Physical Sciences Research Council (EP/L016087/1)
Engineering and Physical Sciences Research Council (EP/K01711X/1)
Engineering and Physical Sciences Research Council (EP/K017144/1)