IMPORTANT INFORMATION: the repository will be upgraded and won't be available from Friday 21 - Monday 24 July inclusive.
Browsing by Author "Humphreys, C"
Research data supporting "X-ray reflectivity method for the characterisation of InGaN/GaN quantum well interface" Massabuau, FCP; Piot, N; Frentrup, M; Wang, X; Avenas, Q; Kappers, M; Humphreys, COliver, R et al.
Massabuau, F; Piot, N; Frentrup, M; Wang, X; Avenas, Q; Kappers, M; Humphreys, COliver, R et al. (Wiley, 2017-01-01)A method to characterize the interface of InGaN/GaN quantum wells by X-ray reflectivity is presented. The interface roughness can be obtained from the ratio of diffuse to specular scatterings obtained on a transverse ω-scan. ...