Hall effect and transmission electron microscopy of epitaxial MnSi thin films
Physical Review B
American Physical Society
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Meynell, S., Wilson, M., Loudon, J., Spitzig, A., Rybakov, F., Johnson, M., & Monchesky, T. (2014). Hall effect and transmission electron microscopy of epitaxial MnSi thin films. Physical Review B, 90 224419. https://doi.org/10.1103/PhysRevB.90.224419
We present Hall effect measurements on MnSi/Si(111) epilayers and find an anomalous Hall contribution that is significantly smaller than in bulk crystals, which enables the observation of an additional contribution to the anomalous signal previously overlooked in MnSi. Our measurements indicate the signal is not due to skyrmions in MnSi thin films, which are absent in out-of-plane fields, but rather are the result of scattering from the cone phase. The absence of magnetic contrast in the transmission electron microscopy (TEM) measurements are consistent with this interpretation. We provide a method to model TEM images of skyrmions lattices to determine the conditions necessary for their observation in other B20 epilayers with an anisotropy that is favourable to their formation.
T.L.M. and M.N.W. acknowledge support from NSERC and the support of the Canada Foundation for Innovation, the Atlantic Innovation Fund, and other partners which fund the Facilities for Materials Characterization, managed by the Institute for Research in Materials. Work done by J.C.L. was funded by the Royal Society. The work of F.N.R. was supported by RFBR, research project No. 14-02-31012.
External DOI: https://doi.org/10.1103/PhysRevB.90.224419
This record's URL: https://www.repository.cam.ac.uk/handle/1810/246864