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dc.contributor.authorCharmet, Jeromeen
dc.contributor.authorDaly, Ronanen
dc.contributor.authorThiruvenkatanathan, Pradyumnaen
dc.contributor.authorSeshia, Ashwinen
dc.date.accessioned2015-07-23T13:35:15Z
dc.date.available2015-07-23T13:35:15Z
dc.date.issued2015-07-28en
dc.identifier.citationCharmet et al. Applied Physics Letters Vol. 107, 043502 (2015). doi: 10.1063/1.4927592
dc.identifier.issn0003-6951
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/249025
dc.description.abstractDissipation mechanisms severely compromise the performance of micro-resonator based sensors. In this letter we specifically examine the shift in resonant frequency of spurious modes towards the mode of interest during mass loading. This can result in modal interaction that degrades the response of the sensor. However, by understanding and controlling this effect we can overcome this key barrier to micro-resonator applications.
dc.languageEnglishen
dc.language.isoenen
dc.publisherAIP
dc.titleThe effect of mass loading on spurious modes in micro-resonatorsen
dc.typeArticle
dc.description.versionThis is the author accepted manuscript. The final version is available from AIP via http://dx.doi.org/10.1063/1.4927592en
prism.number043502en
prism.publicationDate2015en
prism.publicationNameApplied Physics Lettersen
prism.volume107en
rioxxterms.versionofrecord10.1063/1.4927592en
rioxxterms.licenseref.urihttp://www.rioxx.net/licenses/all-rights-reserveden
rioxxterms.licenseref.startdate2015-07-28en
dc.contributor.orcidDaly, Ronan [0000-0002-8299-5755]
dc.contributor.orcidSeshia, Ashwin [0000-0001-9305-6879]
dc.identifier.eissn1077-3118
rioxxterms.typeJournal Article/Reviewen


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