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dc.contributor.authorKumar, Aen
dc.contributor.authorFlewitt, Andrewen
dc.date.accessioned2015-07-23T14:50:20Z
dc.date.available2015-07-23T14:50:20Z
dc.date.issued2015-07-28en
dc.identifier.citationKumar & Flewitt. Journal of Display Technology (2016), 12(3), pp. 240-246. doi:10.1109/JDT.2015.2462291
dc.identifier.issn1551-319X
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/249035
dc.description.abstractNew generation of thin-film transistors (TFTs), where the active material is amorphous oxide, conjugated polymer, or small molecules, have the advantage of flexibility, high form factor, and large scale manufacturability through low cost processing techniques, e.g., roll-to-roll printing, screen printing. During high-throughput production using these techniques, the probability of defects being present increases with the speed of manufacturing and area of devices. Therefore a high-throughput and low cost testing technique is absolute essential to maintain high quality of final product. We report a Simultaneous Multiple Device Testing (SMuDT) approach which is up to 10 times faster and cost effective than conventional testing methods. The SMuDT approach was validated using circuit simulation and demonstrated by testing large scale indium gallium zinc oxide (IGZO) TFTs. A method to ‘bin’ the tested devices using Figure of Merit was established.
dc.description.sponsorshipThe authors acknowledge the support of this project provided by the EPSRC and Innovate UK through the AUTOFLEX Project (grant no. EP/L505201/1) and CIMLAE Project (EP/K03099X/1). AK and AJF would like to thank PragmatIC Printing Ltd. for wafer samples. Additional data related to this publication which is not of a commercially sensitive nature is available at the DSpace@Cambridge data repository (www.repository.cam.ac.uk).
dc.languageEnglishen
dc.language.isoenen
dc.rightsAttribution 3.0 UK: England & Wales
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/uk/
dc.subjectcircuit simulationen
dc.subjectflexible circuits and displayen
dc.subjecthigh-throughput electrical testingen
dc.subjectIGZO thin-film transistors (TFTs)en
dc.titleAn Approach to Simultaneously Test Multiple Devices for High-Throughput Production of Thin-Film Electronicsen
dc.typeArticle
dc.description.versionThis is the final version of the article. It first appeared from IEEE via http://dx.doi.org/10.1109/JDT.2015.2462291en
prism.endingPage246
prism.publicationDate2015en
prism.publicationNameJournal of Display Technologyen
prism.startingPage240
prism.volume12en
dc.rioxxterms.funderEPSRC
dc.rioxxterms.funderInnovate UK
dc.rioxxterms.projectidEP/L505201/1
dc.rioxxterms.projectidEP/K03099X/1
rioxxterms.versionofrecord10.1109/JDT.2015.2462291en
rioxxterms.licenseref.urihttp://www.rioxx.net/licenses/all-rights-reserveden
rioxxterms.licenseref.startdate2015-07-28en
dc.contributor.orcidFlewitt, Andrew [0000-0003-4204-4960]
dc.identifier.eissn1558-9323
rioxxterms.typeJournal Article/Reviewen
pubs.funder-project-idEPSRC (EP/K03099X/1)
pubs.funder-project-idEPSRC (EP/L505201/1)
cam.orpheus.successThu Jan 30 12:55:57 GMT 2020 - The item has an open VoR version.*
rioxxterms.freetoread.startdate2300-01-01


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Attribution 3.0 UK: England & Wales
Except where otherwise noted, this item's licence is described as Attribution 3.0 UK: England & Wales