Atom-probe field-ion microscopy
| dc.contributor.author | Regan, Bernard John | en |
| dc.date.accessioned | 2015-09-16T14:27:24Z | |
| dc.date.available | 2015-09-16T14:27:24Z | |
| dc.date.issued | 1973-10-30 | en |
| dc.identifier.other | PhD.8558 | en |
| dc.identifier.uri | https://www.repository.cam.ac.uk/handle/1810/250669 | |
| dc.description | The field-ion microscope has the ability to resolve single atoms but there is no unambiguous correlation between the appearance of a spot in the field-ion image and the chemical nature of the chemical identification of an individual atom led to the invention of the atom-probe which is a time-of-flight mass spectrometer attached to a field-ion microscope. In general the atom-probe is not used to analyse single atoms but instead to obtain an estimate of the composition of a small region. To facilitate the collection of a large number of ions in a reasonable time an electronic timer and semi-automatic control system has been built. With the larger number of results available it has been possible to plot "mass spectra" and the factors affecting the form of a mass spectrum have been investigated. In some cases the high spatial resolution of the field-ion microscope is only required in a direction perpendicular to the specimen surface, and to obtain an even larger sample from such specimens a modified atom probe has been constructed in a prototype form. The range of applications of the atom-probe is also discussed. | en |
| dc.title | Atom-probe field-ion microscopy | en |
| dc.type | Thesis | en |
| dc.type.qualificationlevel | Doctoral | |
| dc.type.qualificationname | Doctor of Philosophy (PhD) | |
| dc.publisher.institution | University of Cambridge | en |
| dc.publisher.department | Department of Materials Science and Metallurgy. | en |
| dc.identifier.doi | 10.17863/CAM.14284 |
