On the failure of graphene devices by Joule heating under current stressing conditions
Applied Physics Letters
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Durkan, C., & Xiao, Z. (2015). On the failure of graphene devices by Joule heating under current stressing conditions. Applied Physics Letters, 107 https://doi.org/10.1063/1.4936993
The behaviour of single layer graphene sections under current-stressing conditions is presented. Graphene devices are stressed to the point of failure and it is seen that they exhibit Joule heating. Using a simple 1-D model for heat generation, we demonstrate how to extract values for the resistivity and thermal coefficient of resistance of graphene devices from their current-voltage characteristics. We also show that graphene flakes with a large number of ripples and folds have higher resistance and fail along a connected pathway of folds.
graphene, Joule heating, devices, tunneling
External DOI: https://doi.org/10.1063/1.4936993
This record's URL: https://www.repository.cam.ac.uk/handle/1810/252720