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Pulsed Field Magnetization of Single-Grain Bulk YBCO Processed from Graded Precursor Powders


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Authors

Ainslie, MD 
Mochizuki, H 
Fujishiro, H 
Zhai, W 
Namburi, DK 

Abstract

Large, single-grain bulk high-temperature superconducting materials can trap high magnetic fields in comparison with conventional permanent magnets, making them ideal candidates to develop more compact and efficient devices, such as actuators, magnetic levitation systems, flywheel energy storage systems and electric machines. However, macrosegregation of Y-211 inclusions in melt-processed Y-Ba-Cu-O (YBCO) limits the macroscopic critical current density of such bulk superconductors, and hence, the potential trapped field. A new fabrication technique using graded precursor powders has recently been developed by our research group, which results in a more uniform distribution of Y-211 particles, in order to further improve the superconducting properties and trapped field capability of such materials.

Large, single-grain bulk high-temperature superconducting materials can trap high magnetic fields in comparison with conventional permanent magnets, making them ideal candidates to develop more compact and efficient devices, such as actuators, magnetic levitation systems, flywheel energy storage systems and electric machines. However, macrosegregation of Y-211 inclusions in melt-processed Y-Ba-Cu-O (YBCO) limits the macroscopic critical current density of such bulk superconductors, and hence, the potential trapped field. A new fabrication technique using graded precursor powders has recently been developed by our research group, which results in a more uniform distribution of Y-211 particles, in order to further improve the superconducting properties and trapped field capability of such materials.

Description

Keywords

Trapped field magnets, bulk superconductors, graded YBCO, pulsed field magnetization, magnetic flux penetration

Journal Title

IEEE Transactions on Applied Superconductivity

Conference Name

Journal ISSN

1051-8223
1558-2515

Volume Title

26

Publisher

Institute of Electrical and Electronics Engineers (IEEE)
Sponsorship
Royal Academy of Engineering (RAEng) (10216/113)
Royal Society (IE131084)
Japan Society for the Promotion of Science (15K04646)
M. D. Ainslie would like to acknowledge financial support from a Royal Academy of Engineering Research Fellowship. This work was also supported by a Royal Society International Exchanges Scheme Grant, IE131084. J. Zou would like to acknowledge financial support from Churchill College, the China Scholarship Council and the Cambridge Commonwealth, European and International Trust.