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dc.contributor.authorIllig, Steffen
dc.contributor.authorEggeman, Alexander S.
dc.contributor.authorTroisi, Alessandro
dc.contributor.authorJiang, Lang
dc.contributor.authorWarwick, Chris
dc.contributor.authorNikolka, Mark
dc.contributor.authorSchweicher, Guillaume
dc.contributor.authorYeates, Stephen G.
dc.contributor.authorGeerts, Yves Henri
dc.contributor.authorAnthony, John E.
dc.descriptionElectron diffraction data is either presented as raw data or converted into txt without any corrections. Files to start the Molecular Dynamics Simulations for TIPS-P and diF-TESADT are provided. We used the MM3 force field. Transistor Characteristics and SKPM scan of rubrene is provided as measured Source Code to run the simulations with exmaple input files are provieded Thin-film structure of TMTES-P as .cif fileen
dc.description.sponsorshipThis work was supported by the EPSRC [research grant number 312483], Royal Society, Winton Programme for the Physics of Sustainability, Cambridge Home and EU scholarship scheme.en
dc.formattxt, cif, raw, xyz, keyen
dc.publisherUniversity of Cambridgeen
dc.rightsAttribution-NonCommercial-ShareAlike 2.0 UK: England & Wales*
dc.subjectElectron Diffractionen
dc.subjectTEM Simulationen
dc.subjectMD Simulationen
dc.subjectTransistor Characteristicsen
dc.titleResearch data supporting "Reducing dynamic disorder in small molecule organic semiconductors by suppressing large-amplitude thermal motions"en
dc.rioxxterms.funderRoyal Society
dc.rioxxterms.funderWinton Programme for the Physics of Sustainability
dc.rioxxterms.funderCambridge Home
dc.rioxxterms.funderEU scholarship scheme
dcterms.formattxt, cif, raw, xyz, key

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Attribution-NonCommercial-ShareAlike 2.0 UK: England & Wales
Except where otherwise noted, this item's licence is described as Attribution-NonCommercial-ShareAlike 2.0 UK: England & Wales