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Research data supporting “Nano-cathodoluminescence reveals the effect of electron damage on the optical properties of nitride optoelectronics and the damage threshold”


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Authors

Griffiths, James T. 
Zhang, Siyuan 
Lhuillier, Jeremy 
Fu, Wai Yuen 
Howkins, Ashley 

Description

Data corresponding to the figures 1, 2, 4, and 5 in the corresponding manuscript.

Version

Software / Usage instructions

Microsoft excel

Keywords

nano-cathodoluminescence, III-nitrides, optoelectronics

Publisher

University of Cambridge
Sponsorship
EPSRC [EP/NO17927/1, EP/J003603/1], ERC [279361 (MACONS)]
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