Robust mapping of electrical properties of graphene from terahertz time-domain spectroscopy with timing jitter correction
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Whelan, P., Iwaszczuk, K., Wang, R., Hofmann, S., Bøggild, P., & Jepsen, P. (2017). Robust mapping of electrical properties of graphene from terahertz time-domain spectroscopy with timing jitter correction. Optics Express, 25 (3), 2725-2732. https://doi.org/10.1364/OE.25.002725
We demonstrate a method for reliably determining the electrical properties of graphene including the carrier scattering time and carrier drift mobility from terahertz time- domain spectroscopy measurements (THz-TDS). By comparing transients originating from directly transmitted pulses and the echoes from internal reflections in a substrate, we are able to extract electrical properties irrespective of random time delays between pulses emitted in a THz-TDS setup. If such time delays are not accounted for they can significantly influence the extracted properties of the material. The technique is useful for a robust determination of electrical properties from THz-TDS measurements and is compatible with substrate materials where transients from internal reflections are well-separated in time.
Fourier transforms, phase shift, Raman spectroscopy, refractive index, terahertz spectroscopy, transmission coefficient
Innovation Fund Denmark (0603-005668B); Danish National Research Foundation (DNRF103); EU Horizon 2020 (696656); Danish Council for Independent Research (64092); EPSRC Doctoral Training Award (EP/M506485/1).
External DOI: https://doi.org/10.1364/OE.25.002725
This record's URL: https://www.repository.cam.ac.uk/handle/1810/263387