Research data supporting 'Exploring piezoelectric properties of III-V nanowires using piezo-response force microscopy'

Calahorra, Y., Guan, X., Halder, N., Smith, M., Cohen, S., Ritter, D., Penuelas, J., & et al. (2017). Research data supporting 'Exploring piezoelectric properties of III-V nanowires using piezo-response force microscopy' [Dataset]. https://doi.org/10.17863/CAM.8982

Description

1. Fig 1 data: XRD raw data. 2. Fig 3 data: 3 matlab figures for each simulation – and the resulting curves. 3. Fig 4 data: 1 AFM image showing topography and KPFM; 1 HSDC file – the origin of presented data. 4. Fig 5 data: 2 AFM images (tapping and QNM) of the NW array, and the NW examined; 1 HSDC file – the origin of the presented data.

Format

Files can be viewed by AFM software, MATLAB and EXCEL

Keywords

Piezoresponse force microscopy, Nanowires, III-V, GaAs, InP

Relationships

Publication Reference: https://doi.org/10.1088/1361-6641/aa6c85 https://www.repository.cam.ac.uk/handle/1810/263714

Sponsorship

European Commission (639526)

Identifiers

This record's DOI: https://doi.org/10.17863/CAM.8982

Rights

Attribution 4.0 International, Attribution 4.0 International, Attribution 4.0 International

Licence URL: http://creativecommons.org/licenses/by/4.0/http://creativecommons.org/licenses/by/4.0/http://creativecommons.org/licenses/by/4.0/

Except where otherwise noted, this item's licence is described as Attribution 4.0 International