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dc.contributor.authorDolby, Ray Milton
dc.date.accessioned2017-07-13T13:30:42Z
dc.date.available2017-07-13T13:30:42Z
dc.date.issued1962-08-23
dc.identifier.otherPhD.4228
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/265306
dc.descriptionThis thesis is not available on this repository until the author agrees to make it public. If you are the author of this thesis and would like to make your work openly available, please contact us: thesis@repository.cam.ac.uk.
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dc.description.abstractThis dissertation describes some new methods for discrimina'ting between the light element characteristic wavelengths in an x-ray scanning microanalyser. For long wavelength microanalysis purposes, the classica1 methods of x-ray spectrometr.v are impracticable. The proportional counter, the best of several possibilities, has there~ore been employed as a dispersive detector, the output pulses subsequently being fu"'1.alysed electronically to yield the necessar.v line intensity information. Proportional counter operation with low energy x-rays is analysed and discussed, and the construction of a suitable counter is described � .Measurements of the quantum yields from carbon and aluminium, . made with this counter, are reported; these measurements, apart from their :fundamental significance., provide an estimate of the performance to be expected from a light element microanalyser. � Several methods of pulse height distribution analysis (deconvolution) are described practically a'tld analysed theoretically. One of the methods, in which the outputs from several pulse anal.yser channels are treated as a set of linear equations which can be solved simultaneously in an electrica1 network, is chosen for development and incorporation into a scanning microanalyser. The design., constrv.ction1 Elld operation of this instrument are described; i ts use is demonstrated 1n several practical examples. The results are presented ElS pictures. with r3solution of 4-5 mi.crons1 showing the surface concentrations of elements as light as beryllium {Z = 4). \
dc.rightsAll Rights Reserveden
dc.rights.urihttps://www.rioxx.net/licenses/all-rights-reserved/en
dc.titleLong wavelength X-ray microanalysis
dc.typeThesis
dc.type.qualificationlevelDoctoral
dc.type.qualificationnameDoctor of Philosophy (PhD)
dc.publisher.institutionUniversity of Cambridge
dc.publisher.departmentDepartment of Physics
dc.identifier.doi10.17863/CAM.11458


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