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dc.contributor.authorNamburi, Devendra
dc.contributor.authorDurrell, John
dc.contributor.authorJaroszynski, Jan
dc.contributor.authorShi, Yunhua
dc.contributor.authorAinslie, Mark
dc.contributor.authorHuang, Danny
dc.contributor.authorDennis, Tony
dc.contributor.authorHellstrom, Eric
dc.contributor.authorCardwell, David
dc.date.accessioned2018-11-06T15:29:15Z
dc.date.available2018-11-06T15:29:15Z
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/284670
dc.descriptionData supporting the publication. The enclosed data set contains raw data connected with measurements relating to trapped field a a function of applied field, temperature as a function of time, tensile strength as measured by Brazillian technique for TSMG and TSIG processed YBCO samples.
dc.formatRaw data in text. The data is used to prepare Figs. 2, 4, 5, 6 and 7.
dc.rightsAttribution 4.0 International (CC BY 4.0)
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.subjectYBCO bulk
dc.subjectInfiltration and Growth
dc.subjectBuffer pellet
dc.subjectLarge trapped field
dc.subjectShrink-fit technique
dc.subjectrelaxation of magnetisation
dc.subjecttensile strength
dc.subjectBrazilian technique
dc.titleResearch data supporting "A Trapped Field of 14.3 T in Y-Ba-Cu-O Bulk Superconductors Fabricated by Buffer-Assisted Seeded Infiltration and Growth"
dc.typeDataset
dc.identifier.doi10.17863/CAM.24728
rioxxterms.licenseref.urihttps://creativecommons.org/licenses/by/4.0/
dcterms.formatExcel
dc.contributor.orcidNamburi, Devendra [0000-0003-3219-2708]
dc.contributor.orcidDurrell, John [0000-0003-0712-3102]
dc.contributor.orcidShi, Yunhua [0000-0003-4240-5543]
dc.contributor.orcidAinslie, Mark [0000-0003-0466-3680]
dc.contributor.orcidHuang, Danny [0000-0001-7476-305X]
dc.contributor.orcidDennis, Tony [0000-0003-4962-7149]
dc.contributor.orcidCardwell, David [0000-0002-2020-2131]
rioxxterms.typeOther
datacite.issupplementto.doi10.1088/1361-6668/aae2cf
datacite.issupplementto.urlhttps://www.repository.cam.ac.uk/handle/1810/285487
datacite.isderivedfrom.doi10.1088/1361-6668/aae2cf


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Attribution 4.0 International (CC BY 4.0)
Except where otherwise noted, this item's licence is described as Attribution 4.0 International (CC BY 4.0)