Morphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images

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Authors

Oliver, Rachel

Sumner, J

Kappers, Menno

  Humphreys, Colin

Publication Date

2009-09-28

Journal Title

Journal of Applied Physics

ISSN

0021-8979

Volume

106

Issue

5

Type

Article

Metadata

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Citation

Oliver, R., Sumner, J., Kappers, M., & Humphreys, C. (2009). Morphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images. Journal of Applied Physics, 106 (5)https://doi.org/10.1063/1.3212971

Sponsorship

EPSRC (EP/E035167/1)

EPSRC (EP/H019324/1)

EPSRC (EP/G042330/1)

Identifiers

External DOI: https://doi.org/10.1063/1.3212971

This record's URL: https://www.repository.cam.ac.uk/handle/1810/286203



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