Morphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images
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Publication Date
2009-09-28Journal Title
Journal of Applied Physics
ISSN
0021-8979
Volume
106
Issue
5
Type
Article
Metadata
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Oliver, R., Sumner, J., Kappers, M., & Humphreys, C. (2009). Morphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images. Journal of Applied Physics, 106 (5)https://doi.org/10.1063/1.3212971
Sponsorship
EPSRC (EP/E035167/1)
EPSRC (EP/H019324/1)
EPSRC (EP/G042330/1)
Identifiers
External DOI: https://doi.org/10.1063/1.3212971
This record's URL: https://www.repository.cam.ac.uk/handle/1810/286203
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