Morphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images

Oliver, RA; Sumner, J; Kappers, MJ; Humphreys, CJ

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Authors

Oliver, RA

Sumner, J

Kappers, MJ

Humphreys, CJ

Publication Date

2009-09-01

Journal Title

J APPL PHYS

ISSN

0021-8979

Publisher

AIP Publishing

Volume

106

Issue

Type

Article

Metadata

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Citation

Oliver, R., Sumner, J., Kappers, M., & Humphreys, C. (2009). Morphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images. J APPL PHYS, 106 (5) https://doi.org/10.1063/1.3212971

Sponsorship

Engineering and Physical Sciences Research Council (EP/E035167/1)

Engineering and Physical Sciences Research Council (EP/G042330/1)

Engineering and Physical Sciences Research Council (EP/H019324/1)

Identifiers

External DOI: https://doi.org/10.1063/1.3212971

This record's URL: https://www.repository.cam.ac.uk/handle/1810/286203

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