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dc.contributor.authorOliver, RA
dc.contributor.authorSumner, J
dc.contributor.authorKappers, MJ
dc.contributor.authorHumphreys, CJ
dc.date.accessioned2018-12-01T00:30:50Z
dc.date.available2018-12-01T00:30:50Z
dc.date.issued2009-09-01
dc.identifier.issn0021-8979
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/286203
dc.publisherAIP Publishing
dc.titleMorphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images
dc.typeArticle
prism.issueIdentifier5
prism.publicationDate2009
prism.publicationNameJ APPL PHYS
prism.volume106
dc.identifier.doi10.17863/CAM.33515
rioxxterms.versionofrecord10.1063/1.3212971
rioxxterms.licenseref.urihttp://www.rioxx.net/licenses/all-rights-reserved
rioxxterms.licenseref.startdate2009-09-28
dc.contributor.orcidOliver, Rachel [0000-0003-0029-3993]
dc.contributor.orcidHumphreys, Colin [0000-0001-5053-3380]
dc.identifier.eissn1089-7550
rioxxterms.typeJournal Article/Review
pubs.funder-project-idEngineering and Physical Sciences Research Council (EP/E035167/1)
pubs.funder-project-idEngineering and Physical Sciences Research Council (EP/G042330/1)
pubs.funder-project-idEngineering and Physical Sciences Research Council (EP/H019324/1)


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