Morphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images

dc.contributor.author	Oliver, RA
dc.contributor.author	Sumner, J
dc.contributor.author	Kappers, MJ
dc.contributor.author	Humphreys, CJ
dc.date.accessioned	2018-12-01T00:30:50Z
dc.date.available	2018-12-01T00:30:50Z
dc.date.issued	2009-09-01
dc.identifier.issn	0021-8979
dc.identifier.uri	https://www.repository.cam.ac.uk/handle/1810/286203
dc.publisher	AIP Publishing
dc.title	Morphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images
dc.type	Article
prism.issueIdentifier	5
prism.publicationDate	2009
prism.publicationName	J APPL PHYS
prism.volume	106
dc.identifier.doi	10.17863/CAM.33515
rioxxterms.versionofrecord	10.1063/1.3212971
rioxxterms.licenseref.uri	http://www.rioxx.net/licenses/all-rights-reserved
rioxxterms.licenseref.startdate	2009-09-28
dc.contributor.orcid	Oliver, Rachel [0000-0003-0029-3993]
dc.contributor.orcid	Humphreys, Colin [0000-0001-5053-3380]
dc.identifier.eissn	1089-7550
rioxxterms.type	Journal Article/Review
pubs.funder-project-id	Engineering and Physical Sciences Research Council (EP/E035167/1)
pubs.funder-project-id	Engineering and Physical Sciences Research Council (EP/G042330/1)
pubs.funder-project-id	Engineering and Physical Sciences Research Council (EP/H019324/1)

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