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dc.contributor.authorBaik, Chan-Wook
dc.contributor.authorYoung Ahn, Ho
dc.contributor.authorKim, Yongsung
dc.contributor.authorLee, Jooho
dc.contributor.authorHong, Seogwoo
dc.contributor.authorHee Choi, Jun
dc.contributor.authorKim, Sunil
dc.contributor.authorHun Lee, Sang
dc.contributor.authorYeon Jun, So
dc.contributor.authorYu, SeGi
dc.contributor.authorLawrence Ives, R
dc.contributor.authorMin Kim, Jong
dc.contributor.authorHwang, Sungwoo
dc.date.accessioned2019-07-31T14:54:29Z
dc.date.available2019-07-31T14:54:29Z
dc.date.issued2014-01-13
dc.identifier.issn0003-6951
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/295125
dc.languageen
dc.language.isoen
dc.publisherAIP Publishing
dc.titleDispersion retrieval from multi-level ultra-deep reactive-ion-etched microstructures for terahertz slow-wave circuits
dc.typeArticle
prism.endingPage021118
prism.issueIdentifier2
prism.publicationDate2014
prism.publicationNameApplied Physics Letters
prism.startingPage021118
prism.volume104
dc.identifier.doi10.17863/CAM.42196
rioxxterms.versionofrecord10.1063/1.4862324
rioxxterms.versionVoR
rioxxterms.licenseref.urihttp://www.rioxx.net/licenses/all-rights-reserved
rioxxterms.licenseref.startdate2014-01-13
dc.identifier.eissn1077-3118
rioxxterms.typeJournal Article/Review


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