Waveguide-Based Platform for Large-FOV Imaging of Optically Active Defects in 2D Materials
Accepted version
Peer-reviewed
Repository URI
Repository DOI
Change log
Authors
Description
Keywords
2D materials, super-resolution, waveguides, imaging, microscopy, defects
Journal Title
ACS Photonics
Conference Name
Journal ISSN
2330-4022
2330-4022
2330-4022
Volume Title
6
Publisher
American Chemical Society (ACS)
Publisher DOI
Rights
All rights reserved
Sponsorship
European Commission Horizon 2020 (H2020) Future and Emerging Technologies (FET) (785219)