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Dataset supporting "Multiple scattering in scanning helium microscopy"


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Type

Dataset

Change log

Authors

Vozdecky, Lubos 
Bergin, Matthew 
Halpin, John E 
MacLaren, Donald A 

Description

The data pack provides helium atom microscope image data for a test sample of FIB-ed trenches in silicon and of an Alvetex scaffold along with simulated ray tracing images for the same test sample. Optical profiler and SEM images are also provided that were used to measure the depth of the trenches. Text description files are included within the archive. The research was supported by EPSRC grants EP/R008272/1 and EP/R008051/1, as well as a Mathworks Ltd. studentship and a Leverhulm visiting professorship.

Version

Software / Usage instructions

The data is split into the 4 difference procedures used to gather it. The Optical profiler data is provided in the .sur file format that can be opened by most scanning probe microscope software (e.g. http://gwyddion.net/). The SEM data is provided as TIFF images along with a .mlx Matlab live script that contains the method for acquiring the trench depths from the images. The SHeM data is provided as .png files, .gwy Gwyddion image files (gwyddion.net/), and as currents within .mat files (opened by Matlab mathworks.com/, or GNU Octave www.gnu.org/software/octave/), the script that accounted for variations in detector behaviour as a .m script file. Simulated data is provided as .png images, .csv text files, and .mat Matlab data files along with the simulation parameters used as a .txt file.

Keywords

Scanning helium microscopy, Neutral atom microscopy, Helium atom scattering, Tissue growth

Publisher

Sponsorship
Engineering and Physical Sciences Research Council (EP/R008272/1)
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