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Direct evidence of polar ferroelastic domain boundaries in semiconductor BiVO4

Accepted version
Peer-reviewed

Type

Article

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Authors

Yokota, H 
Hasegawa, N 
Glazer, M 
Salje, EKH 
Uesu, Y 

Abstract

Ferroelastic domain boundaries in semiconductor bismuth vanadate, BiVO4, are examined using second harmonic generation microscopy. Although the bulk is centrosymmetric, domain boundaries produce homogeneous second harmonic (SH) signals. The polarization dependences of SH intensities exhibit strong anisotropy compatible with the polar symmetry m. The present results are compared with the experimental results of other ferroelastics we have observed so far. Unlike other ferroelastic materials, the directions of the SH maxima are in the same direction for all domain boundaries.

Description

Keywords

51 Physical Sciences

Journal Title

Applied Physics Letters

Conference Name

Journal ISSN

0003-6951
1077-3118

Volume Title

116

Publisher

AIP Publishing

Rights

All rights reserved
Sponsorship
Engineering and Physical Sciences Research Council (EP/P024904/1)