Defects in complex oxide thin films for electronics and energy applications: Challenges and opportunities
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Peer-reviewed
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Article
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Abstract
This review focuses on recent progress in defect-engineered novel functionalities of complex oxide thin films for electronics and energy applications, and current challenges and perspectives.
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Keywords
40 Engineering, 4016 Materials Engineering, 34 Chemical Sciences, 3406 Physical Chemistry, 7 Affordable and Clean Energy
Journal Title
Materials Horizons
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Journal ISSN
2051-6347
2051-6355
2051-6355
Volume Title
7
Publisher
Royal Society of Chemistry (RSC)
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Sponsorship
Engineering and Physical Sciences Research Council (EP/N004272/1)
Engineering and Physical Sciences Research Council (EP/L011700/1)
Isaac Newton Trust (18.23(G))
EPSRC (EP/T012218/1)
Royal Academy of Engineering (RAEng) (CiET1819\24)
Leverhulme Trust (RPG-2015-017)
European Research Council (779444)
Engineering and Physical Sciences Research Council (EP/L011700/1)
Isaac Newton Trust (18.23(G))
EPSRC (EP/T012218/1)
Royal Academy of Engineering (RAEng) (CiET1819\24)
Leverhulme Trust (RPG-2015-017)
European Research Council (779444)
J.L.M.-D. also acknowledges support from the Royal Academy of Engineering, Grant CiET1819_24, and the ERC POC grant, 779444, Portapower. K.H.L.Z. is grateful for funding support from the National Natural Science Foundation of China (Grant No. 21872116).