Data supporting "On the extraction of yield stresses from micro-compression experiments"

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Authors
Pürstl, Julia
Jones, Hannah O
Edwards, Thomas EJ
Thompson, Robert P
Di Gioacchino, Fabio
  Jones, Nick
Clegg, William J
Publication Date
2020-10-08
Type
Dataset
Metadata
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Citation
Pürstl, J., Jones, H. O., Edwards, T. E., Thompson, R. P., Di Gioacchino, F., Jones, N., & Clegg, W. J. (2020). Data supporting "On the extraction of yield stresses from micro-compression experiments" [Dataset]. https://doi.org/10.17863/CAM.58215
Description
Raw data supporting the publication. Original SEM images of micropillar before and after compression as input for digital image correlation obtained using a FEI Helios Nanolab dual beam FIB/SEM. Drift and rig compliance corrected load-displacement data obtained using an Alemnis nanoindenter in combination with the software Micromechanics Analyser (EMPA).
Format
Scanning electron microscopy images suitable for direct input in DaVis (LaVision) digital image correlation software (Image settings: Acceleration Voltage 15 kV, Beam Current 1.375 nA, Working Distance 4 mm, Magnification x 6500, Dwell Time 30 μs, Resolution 4096 x 3536 px, Pixel size 4.8 nm). Load-displacement data corrected for machine compliance and drift, suitable for further analysis.
Keywords
Digital image correlation, Micropillar compression
Relationships
Publication Reference: https://doi.org/10.1016/j.msea.2020.140323https://www.repository.cam.ac.uk/handle/1810/310923
Identifiers
This record's DOI: https://doi.org/10.17863/CAM.58215

Rights
Attribution 4.0 International, Attribution 4.0 International
Licence URL: http://creativecommons.org/licenses/by/4.0/http://creativecommons.org/licenses/by/4.0/

Attribution 4.0 International
Except where otherwise noted, this item's licence is described as Attribution 4.0 International