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dc.contributor.authorSmith, Lukeen
dc.contributor.authorBatey, Jack Oen
dc.contributor.authorAlexander-Webber, Jack Allenen
dc.contributor.authorFan, Yeen
dc.contributor.authorHsieh, Yu-Chiangen
dc.contributor.authorFung, Shin-Jren
dc.contributor.authorJevtics, Dimitarsen
dc.contributor.authorRobertson, Joshuaen
dc.contributor.authorGuilhabert, Benoit JEen
dc.contributor.authorStrain, Michael Jen
dc.contributor.authorDawson, Martin Den
dc.contributor.authorHurtado, Antonioen
dc.contributor.authorGriffiths, Jonathan Pen
dc.contributor.authorBeere, Harveyen
dc.contributor.authorJagadish, Chennupatien
dc.contributor.authorBurton, Oliveren
dc.contributor.authorHofmann, Stephanen
dc.contributor.authorChen, Tse-Mingen
dc.contributor.authorRitchie, Daviden
dc.contributor.authorKelly, Michaelen
dc.contributor.authorJoyce, Hannahen
dc.contributor.authorSmith, Charlesen
dc.date.accessioned2020-10-16T11:32:30Z
dc.date.available2020-10-16T11:32:30Z
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/311600
dc.descriptionMeasurements are performed using electrical methods described in the paper. Data to generate all plots in the associated publication are contained within the zipped file as separate ‘.txt’ files. The README.txt file contains information about each separate file.en
dc.formatThese data files can be opened using any text editor.en
dc.rightsAttribution 4.0 Internationalen
dc.rightsAttribution 4.0 Internationalen
dc.rightsAttribution 4.0 Internationalen
dc.rightsAttribution 4.0 Internationalen
dc.rightsAttribution 4.0 Internationalen
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.subjectNanoelectronic device arraysen
dc.subjectScalable fabricationen
dc.subjectHigh-throughput testingen
dc.subjectGraphene and 2D materialsen
dc.subjectNanowiresen
dc.subjectElectronic characterisationen
dc.titleResearch data supporting ‘High-Throughput Electrical Characterisation of Nanomaterials From Room to Cryogenic Temperatures’en
dc.typeDataset
dc.identifier.doi10.17863/CAM.58559
rioxxterms.licenseref.urihttp://creativecommons.org/licenses/by/4.0/en
datacite.contributor.supervisorSmith, Charles G
dcterms.formattxten
dc.contributor.orcidSmith, Luke [0000-0003-2194-4708]
dc.contributor.orcidAlexander-Webber, Jack Allen [0000-0002-9374-7423]
dc.contributor.orcidFan, Ye [0000-0003-0998-5881]
dc.contributor.orcidBeere, Harvey [0000-0001-5630-2321]
dc.contributor.orcidBurton, Oliver [0000-0002-2060-1714]
dc.contributor.orcidHofmann, Stephan [0000-0001-6375-1459]
dc.contributor.orcidRitchie, David [0000-0002-9844-8350]
dc.contributor.orcidJoyce, Hannah [0000-0002-9737-680X]
dc.contributor.orcidSmith, Charles [0000-0002-5611-0095]
rioxxterms.typeOtheren
pubs.funder-project-idEngineering and Physical Sciences Research Council (EP/R029075/1)
pubs.funder-project-idEPSRC (EP/P005152/1)
pubs.funder-project-idEPSRC (EP/M508007/1)
pubs.funder-project-idEPSRC (via University of Glasgow) (EP/R03480X/1)
datacite.issupplementto.doi10.1021/acsnano.0c05622en
datacite.issupplementto.urlhttps://www.repository.cam.ac.uk/handle/1810/311451


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Attribution 4.0 International
Except where otherwise noted, this item's licence is described as Attribution 4.0 International