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dc.contributor.authorAbe, Ken
dc.contributor.authorAkhlaq, Nen
dc.contributor.authorAkutsu, Ren
dc.contributor.authorAli, Aen
dc.contributor.authorAlt, Cen
dc.contributor.authorAndreopoulos, Cen
dc.contributor.authorAnthony, Len
dc.contributor.authorAntonova, Men
dc.contributor.authorAoki, Sen
dc.contributor.authorAriga, Aen
dc.contributor.authorArihara, Ten
dc.contributor.authorAsada, Yen
dc.contributor.authorAshida, Yen
dc.contributor.authorAtkin, ETen
dc.contributor.authorAwataguchi, Yen
dc.contributor.authorBan, Sen
dc.contributor.authorBarbi, Men
dc.contributor.authorBarker, GJen
dc.contributor.authorBarr, Gen
dc.contributor.authorBarrow, Den
dc.contributor.authorBarry, Cen
dc.contributor.authorBatkiewicz-Kwasniak, Men
dc.contributor.authorBeloshapkin, Aen
dc.contributor.authorBench, Fen
dc.contributor.authorBerardi, Ven
dc.contributor.authorBerns, Len
dc.contributor.authorBhadra, Sen
dc.contributor.authorBienstock, Sen
dc.contributor.authorBlondel, Aen
dc.contributor.authorBolognesi, Sen
dc.contributor.authorBonus, Ten
dc.contributor.authorBourguille, Ben
dc.contributor.authorBoyd, SBen
dc.contributor.authorBrailsford, Den
dc.contributor.authorBravar, Aen
dc.contributor.authorBravo Berguño, Den
dc.contributor.authorBronner, Cen
dc.contributor.authorBron, Sen
dc.contributor.authorBubak, Aen
dc.contributor.authorBuizza Avanzini, Men
dc.contributor.authorCalcutt, Jen
dc.contributor.authorCampbell, Ten
dc.contributor.authorCao, Sen
dc.contributor.authorCartwright, SLen
dc.contributor.authorCatanesi, MGen
dc.contributor.authorCervera, Aen
dc.contributor.authorChappell, Aen
dc.contributor.authorChecchia, Cen
dc.contributor.authorCherdack, Den
dc.contributor.authorChikuma, Nen
dc.contributor.authorChristodoulou, Gen
dc.contributor.authorCicerchia, Men
dc.contributor.authorColeman, Jen
dc.contributor.authorCollazuol, Gen
dc.contributor.authorCook, Len
dc.contributor.authorCoplowe, Den
dc.contributor.authorCudd, Aen
dc.contributor.authorDabrowska, Aen
dc.contributor.authorDe Rosa, Gen
dc.contributor.authorDealtry, Ten
dc.contributor.authorDenner, PFen
dc.contributor.authorDennis, Steveen
dc.contributor.authorDensham, Cen
dc.contributor.authorDi Lodovico, Fen
dc.contributor.authorDokania, Nen
dc.contributor.authorDolan, Sen
dc.contributor.authorDoyle, TAen
dc.contributor.authorDrapier, Oen
dc.contributor.authorDumarchez, Jen
dc.contributor.authorDunne, Pen
dc.contributor.authorEguchi, Aen
dc.contributor.authorEklund, Len
dc.contributor.authorEmery-Schrenk, Sen
dc.contributor.authorEreditato, Aen
dc.contributor.authorFernandez, Pen
dc.contributor.authorFeusels, Ten
dc.contributor.authorFinch, AJen
dc.contributor.authorFiorentini, GAen
dc.contributor.authorFiorillo, Gen
dc.contributor.authorFrancois, Cen
dc.contributor.authorFriend, Men
dc.contributor.authorFujii, Yen
dc.contributor.authorFujita, Ren
dc.contributor.authorFukuda, Den
dc.contributor.authorFukuda, Ren
dc.contributor.authorFukuda, Yen
dc.contributor.authorFusshoeller, Ken
dc.contributor.authorGiganti, Cen
dc.contributor.authorGolan, Ten
dc.contributor.authorGonin, Men
dc.contributor.authorGorin, Aen
dc.contributor.authorGuigue, Men
dc.contributor.authorHadley, DRen
dc.contributor.authorHaigh, JTen
dc.contributor.authorHamacher-Baumann, Pen
dc.contributor.authorHartz, Men
dc.contributor.authorHasegawa, Ten
dc.contributor.authorHassani, Sen
dc.contributor.authorHastings, NCen
dc.contributor.authorHayashino, Ten
dc.date.accessioned2020-12-01T12:06:58Z
dc.date.available2020-12-01T12:06:58Z
dc.date.issued2020-10-01en
dc.identifier.issn1029-8479
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/313642
dc.description.abstract© 2020, The Author(s). The electron (anti-)neutrino component of the T2K neutrino beam constitutes the largest background in the measurement of electron (anti-)neutrino appearance at the far detector. The electron neutrino scattering is measured directly with the T2K off-axis near detector, ND280. The selection of the electron (anti-)neutrino events in the plastic scintillator target from both neutrino and anti-neutrino mode beams is discussed in this paper. The flux integrated single differential charged-current inclusive electron (anti-)neutrino cross-sections, dσ/dp and dσ/d cos(θ), and the total cross-sections in a limited phase-space in momentum and scattering angle (p > 300 MeV/c and θ ≤ 45°) are measured using a binned maximum likelihood fit and compared to the neutrino Monte Carlo generator predictions, resulting in good agreement.
dc.rightsAttribution 4.0 International
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.titleMeasurement of the charged-current electron (anti-)neutrino inclusive cross-sections at the T2K off-axis near detector ND280en
dc.typeArticle
prism.issueIdentifier10en
prism.publicationDate2020en
prism.publicationNameJournal of High Energy Physicsen
prism.volume2020en
dc.identifier.doi10.17863/CAM.60747
dcterms.dateAccepted2020-09-13en
rioxxterms.versionofrecord10.1007/JHEP10(2020)114en
rioxxterms.versionVoR
rioxxterms.licenseref.urihttp://www.rioxx.net/licenses/all-rights-reserveden
rioxxterms.licenseref.startdate2020-10-01en
dc.contributor.orcidDennis, Steve [0000-0001-9099-8895]
dc.identifier.eissn1029-8479
rioxxterms.typeJournal Article/Reviewen


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Attribution 4.0 International
Except where otherwise noted, this item's licence is described as Attribution 4.0 International