Observation of diffraction contrast in scanning helium microscopy
Authors
Bergin, M.
Lambrick, S. M.
Sleath, H.
Ward, D. J.
Ellis, J.
Jardine, A. P.
Publication Date
2020-02-06Journal Title
Scientific Reports
Publisher
Nature Publishing Group UK
Volume
10
Issue
1
Language
en
Type
Article
This Version
VoR
Metadata
Show full item recordCitation
Bergin, M., Lambrick, S. M., Sleath, H., Ward, D. J., Ellis, J., & Jardine, A. P. (2020). Observation of diffraction contrast in scanning helium microscopy. Scientific Reports, 10 (1) https://doi.org/10.1038/s41598-020-58704-1
Abstract
Abstract: Scanning helium microscopy is an emerging form of microscopy using thermal energy neutral helium atoms as the probe particle. The very low energy combined with lack of charge gives the technique great potential for studying delicate systems, and the possibility of several new forms of contrast. To date, neutral helium images have been dominated by topographic contrast, relating to the height and angle of the surface. Here we present data showing contrast resulting from specular reflection and diffraction of helium atoms from an atomic lattice of lithium fluoride. The signature for diffraction is evident by varying the scattering angle and observing sharp features in the scattered distribution. The data indicates the viability of the approach for imaging with diffraction contrast and suggests application to a wide variety of other locally crystalline materials.
Keywords
Article, /639/766/119, /639/766/930/2735, /639/766/36/1120, article
Sponsorship
Engineering and Physical Sciences Research Council (EP/R008272/1, EP/R008272/1, EP/R008272/1, EP/R008272/1, EP/R008272/1)
Identifiers
s41598-020-58704-1, 58704
External DOI: https://doi.org/10.1038/s41598-020-58704-1
This record's URL: https://www.repository.cam.ac.uk/handle/1810/317224
Rights
Attribution 4.0 International (CC BY 4.0)
Licence URL: https://creativecommons.org/licenses/by/4.0/
Statistics
Total file downloads (since January 2020). For more information on metrics see the
IRUS guide.