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dc.contributor.authorO'Hanlon, TJ
dc.contributor.authorMassabuau, FC-P
dc.contributor.authorBao, A
dc.contributor.authorKappers, Menno
dc.contributor.authorOliver, Rachel
dc.date.accessioned2021-02-24T00:30:35Z
dc.date.available2021-02-24T00:30:35Z
dc.date.issued2021-03-11
dc.identifier.issn0304-3991
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/318037
dc.description.abstractDirectly correlated measurements of the surface morphology, light emission and subsurface structure and composition were carried out on the exact same nanoscale trench defects in InGaN quantum well (QW) structures. Multiple scanning probe, scanning electron and transmission electron microscopy techniques were used to explain the origin of their unusual emission behaviour and the relationship between surface morphology and cathodoluminescence (CL) redshift. Trench defects comprise of an open trench partially or fully enclosing material in InGaN QWs with different CL emission properties to their surroundings. The CL redshift was shown to typically vary with the width of the trench and the prominence of the material enclosed by the trench above its surroundings. Three defects, encompassing typical and atypical features, were prepared into lamellae for transmission electron microscopy (TEM). A cross marker technique was used in the focused ion beam-scanning electron microscope (FIB-SEM) to centre the previously characterised defects in each lamella for further analysis. The defects with wider trenches and strong redshifts in CL emission had their initiating basal-plane stacking fault (BSF) towards the bottom of the QW stack, while the BSF formed near the top of the QW stack for a defect with a narrow trench and minimal redshift. The raised-centre, prominent defect showed a slight increase in QW thickness moving up the QW stack while QW widths in the level-centred defect remained broadly constant. The indium content of the enclosed QWs increased above the BSF positions up to a maximum, with an increase of approximately 4% relative to the surroundings seen for one defect examined. Gross fluctuations in QW width (GWWFs) were present in the surrounding material in this sample but were not seen in QWs enclosed by the defect volumes. These GWWFs have been linked with indium loss from surface step edges two or more monolayers high, and many surface step edges appear pinned by the open trenches, suggesting another reason for the higher indium content seen in QWs enclosed by trench defects.
dc.description.sponsorshipERC
dc.format.mediumPrint-Electronic
dc.languageeng
dc.publisherElsevier BV
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 International
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/
dc.titleDirectly correlated microscopy of trench defects in InGaN quantum wells.
dc.typeArticle
prism.publicationDate2021
prism.publicationNameUltramicroscopy
prism.startingPage113255
dc.identifier.doi10.17863/CAM.65152
dcterms.dateAccepted2021-02-20
rioxxterms.versionofrecord10.1016/j.ultramic.2021.113255
rioxxterms.versionAM
rioxxterms.licenseref.urihttp://www.rioxx.net/licenses/all-rights-reserved
rioxxterms.licenseref.startdate2021-03-11
dc.contributor.orcidOliver, Rachel [0000-0003-0029-3993]
dc.identifier.eissn1879-2723
rioxxterms.typeJournal Article/Review
pubs.funder-project-idEuropean Research Council (279361)
pubs.funder-project-idEngineering and Physical Sciences Research Council (EP/M010589/1)
datacite.issupplementedby.urlhttps://doi.org/10.17863/CAM.66046
cam.orpheus.successMon Mar 29 07:30:54 BST 2021 - Embargo updated
cam.orpheus.counter4
rioxxterms.freetoread.startdate2022-03-11


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