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dc.contributor.authorCao, Rien
dc.contributor.authorHansen, Lars Nen
dc.contributor.authorThom, Christopher Aen
dc.contributor.authorWallis, Daviden
dc.date.accessioned2021-07-12T10:57:29Z
dc.date.available2021-07-12T10:57:29Z
dc.date.issued2021-07-01en
dc.identifier.issn0034-6748
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/325037
dc.description.abstractWe describe a high-temperature, uniaxial creep apparatus designed to investigate nonlinear attenuation of materials over a wide range of temperatures (25–1300 ○C) using forced oscillations combined with a bias stress. This apparatus is primarily designed for investigation of minerals and rocks with high melting temperatures. An oscillatory compressional stress is used to determine attenuation and Young’s modulus at frequencies of 10−1 –102 Hz and high stress amplitudes (>0.1 MPa). Large bias stresses are applied in addition to the oscillatory stresses such that attenuation tests are conducted simultaneously with the ongoing creep. The complex compliance of the apparatus was characterized by conducting calibration tests on orientated crystals of sapphire. The real part of the apparatus compliance exhibits a dependence on sample length and frequency, whereas the imaginary part is only dependent on frequency. The complex compliance is not dependent on the oscillation amplitude or the bias stress. We assess the accuracy and precision of this calibration by comparing measurements of the attenuation and Young’s modulus of aluminum and acrylic to previously published values. We outline a set of criteria defining the conditions over which this apparatus can precisely determine the attenuation and Young’s modulus of a sample based on the sample length and expected values of attenuation and Young’s modulus.
dc.languageenen
dc.publisherAIP Publishing
dc.rightsPublisher's own licence
dc.rights.uri
dc.titleAn apparatus for measuring nonlinear viscoelasticity of minerals at high temperatureen
dc.typeArticle
prism.endingPage073902
prism.issueIdentifier7en
prism.publicationDate2021en
prism.publicationNameReview of Scientific Instrumentsen
prism.startingPage073902
prism.volume92en
dc.identifier.doi10.17863/CAM.72492
dcterms.dateAccepted2021-06-19en
rioxxterms.versionofrecord10.1063/5.0035699en
rioxxterms.versionVoR
rioxxterms.licenseref.urihttp://www.rioxx.net/licenses/all-rights-reserveden
rioxxterms.licenseref.startdate2021-07-01en
dc.contributor.orcidWallis, David [0000-0001-9212-3734]
dc.identifier.eissn1089-7623
rioxxterms.typeJournal Article/Reviewen
cam.orpheus.successMon Jul 12 16:35:38 BST 2021 - Embargo updated*
rioxxterms.freetoread.startdate2022-07-12


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