Super-resolution structured illumination microscopy: past, present and future.
Published version
Peer-reviewed
Repository URI
Repository DOI
Change log
Authors
Prakash, Kirti https://orcid.org/0000-0002-0325-9988
Diederich, Benedict
Reichelt, Stefanie https://orcid.org/0000-0003-4151-0712
Heintzmann, Rainer
Schermelleh, Lothar
Abstract
Structured illumination microscopy (SIM) has emerged as an essential technique for three-dimensional (3D) and live-cell super-resolution imaging. However, to date, there has not been a dedicated workshop or journal issue covering the various aspects of SIM, from bespoke hardware and software development and the use of commercial instruments to biological applications. This special issue aims to recap recent developments as well as outline future trends. In addition to SIM, we cover related topics such as complementary super-resolution microscopy techniques, computational imaging, visualization and image processing methods. This article is part of the Theo Murphy meeting issue 'Super-resolution structured illumination microscopy (part 1)'.
Description
Keywords
computational imaging, frugal microscopy, image processing, spatial resolution, structured illumination microscopy, super-resolution microscopy
Journal Title
Philos Trans A Math Phys Eng Sci
Conference Name
Journal ISSN
1364-503X
1471-2962
1471-2962
Volume Title
379
Publisher
The Royal Society