Negatively Charged In-Plane and Out-Of-Plane Domain Walls with Oxygen-Vacancy Agglomerations in a Ca-Doped Bismuth-Ferrite Thin Film.
dc.contributor.author | Haselmann, Ulrich | |
dc.contributor.author | Suyolcu, Y Eren | |
dc.contributor.author | Wu, Ping-Chun | |
dc.contributor.author | Ivanov, Iurii | |
dc.contributor.author | Knez, Daniel | |
dc.contributor.author | van Aken, Peter A | |
dc.contributor.author | Chu, Ying-Hao | |
dc.contributor.author | Zhang, Zaoli | |
dc.date.accessioned | 2021-12-03T00:30:23Z | |
dc.date.available | 2021-12-03T00:30:23Z | |
dc.date.issued | 2021-10-26 | |
dc.identifier.issn | 2637-6113 | |
dc.identifier.uri | https://www.repository.cam.ac.uk/handle/1810/331220 | |
dc.description.abstract | The interaction of oxygen vacancies and ferroelectric domain walls is of great scientific interest because it leads to different domain-structure behaviors. Here, we use high-resolution scanning transmission electron microscopy to study the ferroelectric domain structure and oxygen-vacancy ordering in a compressively strained Bi0.9Ca0.1FeO3-δ thin film. It was found that atomic plates, in which agglomerated oxygen vacancies are ordered, appear without any periodicity between the plates in out-of-plane and in-plane orientation. The oxygen non-stoichiometry with δ ≈ 1 in FeO2-δ planes is identical in both orientations and shows no preference. Within the plates, the oxygen vacancies form 1D channels in a pseudocubic [010] direction with a high number of vacancies that alternate with oxygen columns with few vacancies. These plates of oxygen vacancies always coincide with charged domain walls in a tail-to-tail configuration. Defects such as ordered oxygen vacancies are thereby known to lead to a pinning effect of the ferroelectric domain walls (causing application-critical aspects, such as fatigue mechanisms and countering of retention failure) and to have a critical influence on the domain-wall conductivity. Thus, intentional oxygen vacancy defect engineering could be useful for the design of multiferroic devices with advanced functionality. | |
dc.format.medium | Print-Electronic | |
dc.publisher | American Chemical Society (ACS) | |
dc.rights | Attribution 4.0 International | |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | |
dc.subject | BiFeO3 | |
dc.subject | oxygen vacancy | |
dc.subject | ordering in oxygen vacancy plates | |
dc.subject | charged domain wall | |
dc.subject | aberration-corrected STEM | |
dc.subject | domain-wall pinning | |
dc.subject | domain-wall nanoelectronics | |
dc.title | Negatively Charged In-Plane and Out-Of-Plane Domain Walls with Oxygen-Vacancy Agglomerations in a Ca-Doped Bismuth-Ferrite Thin Film. | |
dc.type | Article | |
dc.publisher.department | Department of Materials Science And Metallurgy | |
dc.date.updated | 2021-12-02T09:30:28Z | |
prism.endingPage | 4508 | |
prism.issueIdentifier | 10 | |
prism.publicationDate | 2021 | |
prism.publicationName | ACS Appl Electron Mater | |
prism.startingPage | 4498 | |
prism.volume | 3 | |
dc.identifier.doi | 10.17863/CAM.78665 | |
dcterms.dateAccepted | 2021-09-12 | |
rioxxterms.versionofrecord | 10.1021/acsaelm.1c00638 | |
rioxxterms.version | VoR | |
dc.contributor.orcid | Suyolcu, Y Eren [0000-0003-0988-5194] | |
dc.contributor.orcid | Ivanov, Iurii [0000-0003-0271-5504] | |
dc.contributor.orcid | Knez, Daniel [0000-0003-0755-958X] | |
dc.contributor.orcid | Chu, Ying-Hao [0000-0002-3435-9084] | |
dc.contributor.orcid | Zhang, Zaoli [0000-0002-7717-2500] | |
dc.identifier.eissn | 2637-6113 | |
rioxxterms.type | Journal Article/Review | |
pubs.funder-project-id | European Commission Horizon 2020 (H2020) Research Infrastructures (RI) (823717) | |
cam.issuedOnline | 2021-09-24 | |
cam.depositDate | 2021-12-02 | |
pubs.licence-identifier | apollo-deposit-licence-2-1 | |
pubs.licence-display-name | Apollo Repository Deposit Licence Agreement |
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