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dc.contributor.authorWalther, T
dc.contributor.authorCalahorra, Yonatan
dc.contributor.authorMassabuau, F
dc.date.accessioned2022-01-28T16:35:31Z
dc.date.available2022-01-28T16:35:31Z
dc.date.issued2020-12
dc.date.submitted2020-08-03
dc.identifier.issn0268-1242
dc.identifier.othersstabb6b9
dc.identifier.otherabb6b9
dc.identifier.othersst-107009
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/333158
dc.languageen
dc.publisherIOP Publishing
dc.subjectEditorial
dc.subjectSpecial Issue on Microscopy of Semiconducting Materials 2019
dc.titlePreface for the special issue on Microscopy of Semiconducting Materials 2019
dc.typeOther
dc.date.updated2022-01-28T16:35:30Z
prism.issueIdentifier12
prism.publicationNameSemiconductor Science and Technology
prism.volume35
dc.identifier.doi10.17863/CAM.80581
dcterms.dateAccepted2020-09-09
rioxxterms.versionofrecord10.1088/1361-6641/abb6b9
rioxxterms.versionVoR
rioxxterms.licenseref.urihttp://creativecommons.org/licenses/by/4.0
dc.contributor.orcidWalther, T [0000-0003-3571-6263]
dc.contributor.orcidCalahorra, Yonatan [0000-0001-9530-1006]
dc.contributor.orcidMassabuau, F [0000-0003-1008-1652]
dc.identifier.eissn1361-6641
cam.issuedOnline2020-10-13


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