Optical emission from focused ion beam milled halide perovskite device crossâsections
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Abstract: Crossâsectional transmission electron microscopy has been widely used to investigate organicâinorganic hybrid halide perovskiteâbased optoelectronic devices. Electronâtransparent specimens (lamellae) used in such studies are often prepared using focused ion beam (FIB) milling. However, the gallium ions used in FIB milling may severely degrade the structure and composition of halide perovskites in the lamellae, potentially invalidating studies performed on them. In this work, the close relationship between perovskite structure and luminescence is exploited to examine the structural quality of perovskite solar cell lamellae prepared by FIB milling. Through hyperspectral cathodoluminescence (CL) mapping, the perovskite layer was found to remain optically active with a slightly blueâshifted luminescence. This finding indicates that the perovskite structure is largely preserved upon the lamella fabrication process although some surface amorphisation occurred. Further changes in CL due to electron beam irradiation were also recorded, confirming that electron dose management is essential in electron microscopy studies of carefully prepared halide perovskiteâbased device lamellae.
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Funder: Jardine Foundation and Cambridge Trust
Funder: Cambridge Royce
Funder: Dr. Christian Monachon from Attolight
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1097-0029
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H2020 European Research Council, HYPERION (756962, 841265)