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Optical emission from focused ion beam milled halide perovskite device cross‐sections

Published version
Peer-reviewed

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Abstract

Abstract: Cross‐sectional transmission electron microscopy has been widely used to investigate organic–inorganic hybrid halide perovskite‐based optoelectronic devices. Electron‐transparent specimens (lamellae) used in such studies are often prepared using focused ion beam (FIB) milling. However, the gallium ions used in FIB milling may severely degrade the structure and composition of halide perovskites in the lamellae, potentially invalidating studies performed on them. In this work, the close relationship between perovskite structure and luminescence is exploited to examine the structural quality of perovskite solar cell lamellae prepared by FIB milling. Through hyperspectral cathodoluminescence (CL) mapping, the perovskite layer was found to remain optically active with a slightly blue‐shifted luminescence. This finding indicates that the perovskite structure is largely preserved upon the lamella fabrication process although some surface amorphisation occurred. Further changes in CL due to electron beam irradiation were also recorded, confirming that electron dose management is essential in electron microscopy studies of carefully prepared halide perovskite‐based device lamellae.

Description

Funder: Jardine Foundation and Cambridge Trust


Funder: Cambridge Royce


Funder: Dr. Christian Monachon from Attolight

Keywords

LETTER, LETTERS, cathodoluminescence, energy conversion and storage, energy harvesting, focused ion beam milling, perovskite, solar

Journal Title

Microscopy Research and Technique

Conference Name

Journal ISSN

1059-910X
1097-0029

Volume Title

Publisher

John Wiley & Sons, Inc.
Sponsorship
Engineering and Physical Sciences Research Council (EP/L015978/1, EP/P007767/1, EP/P024947/1, EP/R023980/1, EP/R025193/1)
H2020 European Research Council, HYPERION (756962, 841265)