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dc.contributor.authorSkalski, P
dc.contributor.authorZadvorna, O
dc.contributor.authorVenkateshvaran, D
dc.contributor.authorSirringhaus, H
dc.date.accessioned2022-03-03T00:30:21Z
dc.date.available2022-03-03T00:30:21Z
dc.date.issued2022
dc.identifier.issn2475-9953
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/334605
dc.description.abstractOver the last two decades organic spintronics has developed into a striving field with exciting reports of long spin diffusion lengths and spin relaxation times in organic semiconductors (OSCs). Easily processed and inexpensive, OSCs are considered a potential alternative to inorganic materials for use in spintronic applications. Spin currents have been detected in a wide range of materials, however, there is still uncertainty over the origin of the signals. Recently, we explored spin transport through an organic semiconductor with lateral spin injection and detection architectures, where the injected spin current is detected non-locally via spin-to-charge conversion in an inorganic detector. In this work we show that the widely-used control experiments like linear power dependence and inversion of the signal with the magnetic field are not sufficient evidence of spin transport and can lead to an incorrect interpretation of the signal. Here, we use in-plane angular dependent measurements to separate pure spin signal from parasitic effects arising from spin rectification (SREs). Apart from well established anisotropic magnetoresistance (AMR) and anomalous Hall effect (AHE), we observed a novel effect which we call spurious inverse spin Hall effect (ISHE). It strongly resembles ISHE behaviour, but arises in the ferromagnet rather than the detector meaning this additional effect has to be considered in future work.
dc.publisherAmerican Physical Society (APS)
dc.rightsPublisher's own licence
dc.subjectcond-mat.mes-hall
dc.subjectcond-mat.mes-hall
dc.titleDistinguishing spin pumping from spin rectification in lateral spin pumping device architectures based on doped organic semiconductors
dc.typeArticle
dc.publisher.departmentDepartment of Physics
dc.date.updated2022-02-28T12:25:48Z
prism.issueIdentifier2
prism.number024601
prism.publicationNamePhysical Review Materials
prism.volume6
dc.identifier.doi10.17863/CAM.82024
dcterms.dateAccepted2022-02-03
rioxxterms.versionofrecord10.1103/PhysRevMaterials.6.024601
rioxxterms.versionAM
dc.contributor.orcidSkalski, Piotr [0000-0003-3102-9837]
dc.contributor.orcidVenkateshvaran, Deepak [0000-0002-7099-7323]
dc.contributor.orcidSirringhaus, Henning [0000-0001-9827-6061]
dc.identifier.eissn2475-9953
rioxxterms.typeJournal Article/Review
pubs.funder-project-idEuropean Research Council (610115)
pubs.funder-project-idRoyal Society (URF\R1\201590)
cam.issuedOnline2022-02-24
cam.orpheus.success2022-03-02 - Embargo set during processing via Fast-track
cam.depositDate2022-02-28
pubs.licence-identifierapollo-deposit-licence-2-1
pubs.licence-display-nameApollo Repository Deposit Licence Agreement
rioxxterms.freetoread.startdate2022-02-24


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