Research data supporting "An approach to simultaneously test multiple devices for high-throughput production of thin-film electronics"
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Description
This is data from developing new testing method under AUTOFLEX Project (EP/L505201/1). This includes Thin-Film Transistor device electrical characterization, Ring Oscillator circuit electrical characterization and circuit simulation.
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MicroSoft Excel Workbook
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University of Cambridge
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Except where otherwised noted, this item's license is described as Attribution-ShareAlike 2.0 UK: England & Wales
Sponsorship
This work was supported by the EPSRC [grant numbers EP/L505201/1, EP/K03099X/1] and Innovate UK.