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The rapidly changing face of electron microscopy


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Type

Article

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Authors

Thomas, JM 
Leary, RK 
Midgley, PA 

Abstract

This short but wide-ranging review is intended to convey to chemical physicists and others engaged in the interfaces between solid-state chemistry and solid-state physics the growing power and extensive applicability of multiple facets of the technique of electron microscopy.

Description

Keywords

51 Physical Sciences, 5104 Condensed Matter Physics

Journal Title

Chemical Physics Letters

Conference Name

Journal ISSN

0009-2614
1873-4448

Volume Title

631-632

Publisher

Elsevier BV
Sponsorship
Engineering and Physical Sciences Research Council (EP/H017712/1)
European Research Council (291522)
R.K.L. acknowledges a Junior Research Fellowship at Clare College. P.A.M. acknowledges funding from the European Research Council under the European Union's Seventh Framework Programme (FP7/2007–2013)/ERC grant agreement 291522-3DIMAGE. A.S.E. acknowledges the Royal Society for funding. J.M.T. is grateful for the support of the Kohn Foundation.