In this study samples of single-grained Eu-Ba-Cu-O-Ag were joined using intermediate slices of Y-Ba-Cu-O-Ag. The term ‘parent’ refers to the original sample before cutting and joining, the term ‘joined’ refers to the sample after joining. The trapped field measurements in this dataset were taken at surface sing a hand-held Hall probe positioned 0.5 mm above the sample surface. The samples had been field cooled to 77 K in an applied magnetic field of 1.4 T prior to trapped field measurement. The temperature of each sample was maintained at 77 K for the duration of the trapped field measurement.

To observe the microstructure the samples were cut in half perpendicular to the joining material and the surface was then polished. The samples were imaged using a scanning electron microscope (SEM) operating at 20 kV using 100x magnification at 1 mm intervals in the c-axis direction in the vicinity of the interface of the join. Further images were taken at 1000x magnification at the join interface and at 2 mm intervals along the c-axis direction within the joining intermediate material. The composition of an area of approximately 140 μm by 100 μm at each of the locations imaged at 1000x magnification within the joining intermediate material were analysed using energy-dispersive x- ray analysis (EDAX) to observe the variation in the distribution of silver, yttrium, barium and copper in the sample microstructure. These data have been normalised to exclude variations in oxygen content within the area analysed (i.e. the sum of the weight percentages of Ag, Y, Ba and Cu has been set equal to 1).