Research data supporting "Effects of post-deposition vacuum annealing on film characteristics of p-type Cu2O and its impact on thin film transistor characteristics"
Repository URI
Repository DOI
Change log
Authors
Han, Sanggil
Niang, Kham M.
Rughoobur, Girish
Flewitt, Andrew J. https://orcid.org/0000-0003-4204-4960
Description
See text files within each folder of the zip file for detailed information on the data.
Version
Software / Usage instructions
Excel
Keywords
cuprous oxide, annealing, thin film transistors
Publisher
University of Cambridge
Sponsorship
EPSRC [EP/M013650/1], Cambridge Trusts