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Transmission-based charge modulation microscopy on conjugated polymer blend field-effect transistors.

Accepted version
Peer-reviewed

Type

Article

Change log

Authors

Nguyen, Malgorzata 
Schnedermann, Christoph  ORCID logo  https://orcid.org/0000-0002-2841-8586
Jacobs, Ian 

Abstract

Charge modulation microscopy (CMM) is an electro-optical method that is capable of mapping the spatial distribution of induced charges in an organic field-effect transistor (OFET). Here, we report a new (and simple) implementation of CMM in transmission geometry with camera-based imaging. A significant improvement in data acquisition speed (by at least an order of magnitude) has been achieved while preserving the spatial and spectral resolution. To demonstrate the capability of the system, we measured the spatial distribution of the induced charges in an OFET with a polymer blend of indacenodithiophene-co-benzothiadiazole and poly-vinylcarbazole that shows micrometer-scale phase separation. We were able to resolve spatial variations in the accumulated charge density on a length scale of 500 nm. We demonstrated through a careful spectral analysis that the measured signal is a genuine charge accumulation signal that is not dominated by optical artifacts.

Description

Keywords

Microscopy, Polymers

Journal Title

J Chem Phys

Conference Name

Journal ISSN

0021-9606
1089-7690

Volume Title

Publisher

AIP Publishing
Sponsorship
EPSRC (EP/W017091/1)
Engineering and Physical Sciences Research Council (EP/R031894/1)
Engineering and Physical Sciences Research Council (EP/S030662/1)
European Commission Horizon 2020 (H2020) Marie Sk?odowska-Curie actions (101022365)