Data supporting "On the extraction of yield stresses from micro-compression experiments"
Repository URI
Repository DOI
Type
Dataset
Change log
Authors
Pürstl, Julia
Jones, Hannah O
Edwards, Thomas EJ
Thompson, Robert P
Di Gioacchino, Fabio
Description
Raw data supporting the publication. Original SEM images of micropillar before and after compression as input for digital image correlation obtained using a FEI Helios Nanolab dual beam FIB/SEM. Drift and rig compliance corrected load-displacement data obtained using an Alemnis nanoindenter in combination with the software Micromechanics Analyser (EMPA).
Version
Software / Usage instructions
Scanning electron microscopy images suitable for direct input in DaVis (LaVision) digital image correlation software (Image settings: Acceleration Voltage 15 kV, Beam Current 1.375 nA, Working Distance 4 mm, Magnification x 6500, Dwell Time 30 μs, Resolution 4096 x 3536 px, Pixel size 4.8 nm).
Load-displacement data corrected for machine compliance and drift, suitable for further analysis.
Keywords
Digital image correlation, Micropillar compression
