Preface for the special issue on Microscopy of Semiconducting Materials 2019

cam.issuedOnline	2020-10-13
dc.contributor.author	Walther, T
dc.contributor.author	Calahorra, Y
dc.contributor.author	Massabuau, F
dc.contributor.orcid	Walther, T [0000-0003-3571-6263]
dc.contributor.orcid	Calahorra, Y [0000-0001-9530-1006]
dc.contributor.orcid	Massabuau, F [0000-0003-1008-1652]
dc.date.accessioned	2022-01-28T16:35:31Z
dc.date.available	2022-01-28T16:35:31Z
dc.date.issued	2020
dc.date.submitted	2020-08-03
dc.date.updated	2022-01-28T16:35:30Z
dc.identifier.doi	10.17863/CAM.80581
dc.identifier.eissn	1361-6641
dc.identifier.issn	0268-1242
dc.identifier.other	sstabb6b9
dc.identifier.other	abb6b9
dc.identifier.other	sst-107009
dc.identifier.uri	https://www.repository.cam.ac.uk/handle/1810/333158
dc.language	en
dc.language.iso	eng
dc.publisher	IOP Publishing
dc.publisher.url	http://dx.doi.org/10.1088/1361-6641/abb6b9
dc.subject	40 Engineering
dc.subject	4009 Electronics, Sensors and Digital Hardware
dc.subject	51 Physical Sciences
dc.subject	5104 Condensed Matter Physics
dc.title	Preface for the special issue on Microscopy of Semiconducting Materials 2019
dc.type	Other
dcterms.dateAccepted	2020-09-09
prism.issueIdentifier	12
prism.publicationName	Semiconductor Science and Technology
prism.volume	35
rioxxterms.licenseref.uri	http://creativecommons.org/licenses/by/4.0
rioxxterms.version	VoR
rioxxterms.versionofrecord	10.1088/1361-6641/abb6b9

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