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Long-Term Stability and Optoelectronic Performance Enhancement of InAsP Nanowires with an Ultrathin InP Passivation Layer.

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cam.issuedOnline2022-04-14
dc.contributor.authorChen, LuLu
dc.contributor.authorAdeyemo, Stephanie O
dc.contributor.authorFonseka, H Aruni
dc.contributor.authorLiu, Huiyun
dc.contributor.authorKar, Srabani
dc.contributor.authorYang, Hui
dc.contributor.authorVelichko, Anton
dc.contributor.authorMowbray, David J
dc.contributor.authorCheng, Zhiyuan
dc.contributor.authorSanchez, Ana M
dc.contributor.authorJoyce, Hannah J
dc.contributor.authorZhang, Yunyan
dc.contributor.orcidFonseka, H Aruni [0000-0003-3410-6981]
dc.contributor.orcidMowbray, David J [0000-0002-7673-6837]
dc.contributor.orcidCheng, Zhiyuan [0000-0002-5603-968X]
dc.contributor.orcidSanchez, Ana M [0000-0002-8230-6059]
dc.contributor.orcidZhang, Yunyan [0000-0002-2196-7291]
dc.date.accessioned2022-05-16T01:02:36Z
dc.date.available2022-05-16T01:02:36Z
dc.date.issued2022-04-27
dc.date.updated2022-05-16T01:02:36Z
dc.descriptionFunder: Leverhulme Trust
dc.description.abstractThe influence of nanowire (NW) surface states increases rapidly with the reduction of diameter and hence severely degrades the optoelectronic performance of narrow-diameter NWs. Surface passivation is therefore critical, but it is challenging to achieve long-term effective passivation without significantly affecting other qualities. Here, we demonstrate that an ultrathin InP passivation layer of 2-3 nm can effectively solve these challenges. For InAsP nanowires with small diameters of 30-40 nm, the ultrathin passivation layer reduces the surface recombination velocity by at least 70% and increases the charge carrier lifetime by a factor of 3. These improvements are maintained even after storing the samples in ambient atmosphere for over 3 years. This passivation also greatly improves the performance thermal tolerance of these thin NWs and extends their operating temperature from <150 K to room temperature. This study provides a new route toward high-performance room-temperature narrow-diameter NW devices with long-term stability.
dc.identifier.doi10.17863/CAM.84600
dc.identifier.eissn1530-6992
dc.identifier.issn1530-6984
dc.identifier.other35420433
dc.identifier.otherPMC9097579
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/337181
dc.languageeng
dc.language.isoeng
dc.publisherAmerican Chemical Society (ACS)
dc.publisher.urlhttp://dx.doi.org/10.1021/acs.nanolett.2c00805
dc.rightsAttribution 4.0 International
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.sourcenlmid: 101088070
dc.sourceessn: 1530-6992
dc.subjectlong-term stability
dc.subjectphotonic properties
dc.subjectsurface passivation
dc.subjectthin nanowire
dc.subjectultrathin InP
dc.titleLong-Term Stability and Optoelectronic Performance Enhancement of InAsP Nanowires with an Ultrathin InP Passivation Layer.
dc.typeArticle
prism.endingPage3439
prism.issueIdentifier8
prism.publicationNameNano Lett
prism.startingPage3433
prism.volume22
pubs.funder-project-idEuropean Research Council (716471)
rioxxterms.licenseref.urihttps://creativecommons.org/licenses/by/4.0/
rioxxterms.versionVoR
rioxxterms.versionofrecord10.1021/acs.nanolett.2c00805

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