Calculating small-angle scattering intensity functions from electron-microscopy images.


Type
Article
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Authors
Doutch, James 
Abstract

We outline procedures to calculate small-angle scattering (SAS) intensity functions from 2-dimensional electron-microscopy (EM) images. Two types of scattering systems were considered: (a) the sample is a set of particles confined to a plane; or (b) the sample is modelled as parallel, infinitely long cylinders that extend into the image plane. In each case, an EM image is segmented into particle instances and the background, whereby coordinates and morphological parameters are computed and used to calculate the constituents of the SAS-intensity function. We compare our results with experimental SAS data, discuss limitations, both general and case specific, and outline some applications of this method which could potentially complement experimental SAS.

Description
Keywords
Journal Title
RSC Adv
Conference Name
Journal ISSN
2046-2069
2046-2069
Volume Title
Publisher
Royal Society of Chemistry (RSC)
Sponsorship
Royal Academy of Engineering (RAEng) (RCSRF1819\7\10)
STFC (Unknown)
STFC (Unknown)
BASF/Royal Academy of Engineering (Research Chair in Data Driven Molecular Engineering of Functional Materials) and the STFC via the ISIS Neutron and Muon Source.