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dc.contributor.authorStanier, Samuel
dc.contributor.authorDijkstra, J
dc.contributor.authorLeśniewska, D
dc.contributor.authorHambleton, J
dc.contributor.authorWhite, D
dc.contributor.authorMuir Wood, D
dc.date.accessioned2019-05-06T23:30:12Z
dc.date.available2019-05-06T23:30:12Z
dc.date.issued2016-02
dc.identifier.issn0266-352X
dc.identifier.urihttps://www.repository.cam.ac.uk/handle/1810/292423
dc.publisherElsevier BV
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 International
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/
dc.titleVermiculate artefacts in image analysis of granular materials
dc.typeArticle
prism.endingPage113
prism.publicationDate2016
prism.publicationNameComputers and Geotechnics
prism.startingPage100
prism.volume72
dc.identifier.doi10.17863/CAM.39580
rioxxterms.versionofrecord10.1016/j.compgeo.2015.11.013
rioxxterms.versionAM
rioxxterms.licenseref.urihttp://www.rioxx.net/licenses/all-rights-reserved
rioxxterms.licenseref.startdate2016-02-01
dc.contributor.orcidStanier, Samuel [0000-0001-5671-2902]
dc.identifier.eissn1873-7633
rioxxterms.typeJournal Article/Review
rioxxterms.freetoread.startdate2017-02-01


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Attribution-NonCommercial-NoDerivatives 4.0 International
Except where otherwise noted, this item's licence is described as Attribution-NonCommercial-NoDerivatives 4.0 International