Research data supporting “Addition of Ge to Cr-Ta-Si Laves phase-based alloys”
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Raw data is provided from ICP-OES, SEM, laboratory XRD, TEM and Vickers Hardness testing. The data from each alloy has been labelled according to the names used in the corresponding paper.
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The data does not need any specialised software to be analysed.
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Except where otherwised noted, this item's license is described as Attribution 4.0 International (CC BY 4.0)