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Research data supporting "Automated Computer Vision-Enabled Manufacturing of Nanowire Devices"


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Type

Dataset

Change log

Authors

Potocnik, Teja 
Christopher, Peter 
Mouthaan, Ralf 
Albrow-Owen, Thomas 
Burton, Oliver 

Description

Figure2c,e: Detected spatial distribution, length and orientation of isolated InAs nanowires in a 1 × 1 mm^2 region.

Figure 4: Transfer characteristics of automatically fabricated nanowire devices with (a) 0.5 μm channel length, (b) 1.0 μm channel length, (c) 2.0 μm channel length, and (d) 2.5 μm channel length at source–drain voltage VDS = 10 mV. (e) Statistical data of nanowire device misalignment measured from the center of the nanowire to the center of the electrode pattern. Statistical data of (f) on/off ratio, (g) peak current, and (h) threshold voltage measured in automatically fabricated nanowire devices.

Figure S8: Statistical data of (a) mobility and (b) hysteresis measured in automatically fabricated nanowire devices.

Version

Software / Usage instructions

Excel

Keywords

computer vision, nanowire, semiconductor

Publisher

Sponsorship
Royal Society (DHF\F1\191163)
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