XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples

Maslakov; Teterin, Yury; Popel, AJ; Teterin, Anton; Ivanov, Kirill; Kalmykov, Stepan; Petrov, Vladimir; Petrov, Peter; Farnan, Ian

doi:10.1016/j.apsusc.2018.04.077

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